Material Analysis for New Technologies
Precise Characterization of Thin Films, Coatings, and Nanomaterials for Innovative Applications
New technologies place ever-increasing demands on materials and their characterization. Thin films, functional coatings, and nanoscale materials enable precisely tunable thermal, electrical, and functional properties, thereby forming the basis for numerous innovations in semiconductor technology, photonics, energy technology, sensor technology, and modern materials systems.
As structural and layer sizes decrease, interfaces, material homogeneity, and direction-dependent transport properties become increasingly important. Even the slightest changes in composition, layer thickness, or manufacturing process can thermal conductivity, electrical conductivity , and the performance of the entire system.
LINSEIS offers specialized measurement solutions for the thermal, thermophysical, and electrical characterization of modern material systems—ranging from individual thin films and coatings to complex multilayers and nanomaterials.
Typical Applications for New Technologies
Select your specific application area to gain detailed insights into measurement methods and solutions for innovative material systems.
Thin-Film Analysis & Coatings
Characterization of the thermal and electrical properties of thin films, functional layers, coatings, and complex multilayer systems.
Nanotechnology
Analysis of the thermal, thermophysical, and electrical properties of nanoscale and nanostructured materials for research and technological development.
Measurement Methods for New Technologies
Thin Film / 3-Omega (TFA)
Determination of the thermal properties of thin films using electrical heating and sensing structures.
Frequency-Domain Thermoreflectance (FDTR)
Noncontact optical characterization of thermal conductivity, temperature conductivity, and thermal interfaces in thin films and multilayer systems.
Hall Effect Analysis (HCS)
Determination of the Hall coefficient, carrier concentration, mobility, and specific electrical resistance in semiconductors and thin films.
Laser Flash Analysis (LFA)
Determination of thermal conductivity and heat conductivity of substrates, functional materials, and innovative materials.
Laser Dilatometry (DIL)
Noncontact measurement of temperature-dependent dimensional changes and the thermal expansion behavior of modern materials.
Seebeck & Resistance Measurement (LSR)
Determination of the Seebeck coefficient and electrical resistance of thermoelectric and functional materials.
Recommended Devices for New Technologies
Top Devices
HCS L36
Other Devices
LSR-3 (LSR L33)
PLH L53 - Periodic Laser Heating
Selected Real-World Measurement Examples
Real-world measurements demonstrate how specialized analytical methods are used in the development and optimization of thin films, coatings, and nanoscale material systems.
Thermal Stability of Cellulose Nanocrystals
Thermoelectric Characterization of PEDOT:PSS Thin Films
Measurements taken with the LINSEIS TFA L59 show the temperature-dependent thermoelectric behavior of a 15 µm-thick PEDOT:PSS layer. By simultaneously measuring electrical conductivity, the Seebeck coefficient, and thermal conductivity, the relevant transport properties can be determined, and the thermoelectric figure of merit (ZT) can be calculated. The results show an increasing ZT value with rising temperature and demonstrate the potential of PEDOT:PSS for flexible thermoelectric applications. Download the white paper to learn more about the comprehensive characterization of thermoelectric thin films.
