Hall Effect Analysis

HCS L36

Precise Hall-effect measurements for semiconductors, thin films and advanced materials

HCS L36: Hall Effect Characterization System

The LINSEIS HCS L36 is a modular Hall-effect characterization system for the precise determination of electrical transport properties of semiconductors, thin films and functional materials. It simultaneously determines carrier concentration, Hall mobility, Hall coefficient and resistivity over a wide temperature range under vacuum or controlled atmospheres.

With three system configurations, interchangeable sample holders and optional Seebeck, Hall bar and illumination modules, the HCS L36 can be tailored to research, development and industrial quality control.

Highlights

Modular Sample Holders
Interchangeable holders for Van der Pauw, Hall Bar, Seebeck and illuminated measurements.

Wide temperature range: measurements from
low temperatures (LN2) up to 600°C possible.

Halbach Magnet Technology
Highly homogeneous magnetic field for maximum Hall measurement accuracy and reproducibility.

LiEAP Software Platform
Integrated measurement control, automation and advanced data evaluation.

Plug & Play Integration
Intelligent EPROM recognition automatically identifies installed sample holders and loads the correct measurement configuration.

Questions? Just give us a call!

+49 (0) 9287/880 0

Our service is available Monday to
Thursday from 8 am to 4 pm
and Friday from 8 am to 12 pm.

We are here for you!

Specifications

Discover the high-performance HCS L36 – developed for maximum accuracy and flexibility in Hall-effect characterization:

  • Measurement methods: DC Hall, AC Hall (optional), Van der Pauw, Hall Bar
  • Sample holders: Standard, Hall Bar, Seebeck, illuminated and custom sample holders
  • Sample size: Up to 12.5 × 12.5 mm² with plug-and-play sample holders
  • Atmospheres: Vacuum and controlled inert, oxidizing or reducing gas atmospheres
  • Upgradeable system: Expandable from Basic to Advanced and Ultimate with optional Seebeck, AC Hall and illumination modules

Method

Hall Effect Characterization

Questions? Just give us a call!

+49 (0) 9287/880 0

Our service is available Monday to
Thursday from 8 am to 4 pm
and Friday from 8 am to 12 pm.

We are here for you!

Software

Making values visible and comparable

General Software Features

  • Modern Windows®-based user interface
  • Intuitive workflow for quick experiment setup
  • Automated instrument and sample holder recognition
  • User and permission management
  • Integrated measurement database
  • Automatic report generation
  • Project-based data organization
  • Export to CSV, Excel and ASCII formats

Hall Measurement Features

  • Automatic Hall coefficient calculation
  • Carrier concentration determination
  • Hall mobility calculation
  • Resistivity and conductivity evaluation
  • n-type / p-type carrier identification
  • Van der Pauw evaluation
  • Hall Bar evaluation
  • Temperature-dependent Hall analysis
  • Batch measurements and automated sequences

Advanced Analysis & Automation

  • AC Hall measurements (optional)
  • Seebeck coefficient evaluation (optional)
  • Illumination measurement support (optional)
  • Real-time graphical data visualization
  • Automatic curve fitting and data correction
  • Comparison of multiple measurements
  • Custom evaluation templates
  • One-click PDF report generation
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Application

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HCS L36

Precise Hall-effect measurements for semiconductors, thin films and advanced materials