Wide-bandgap semiconductors

Material analysis for SiC, GaN, and other wide-bandgap semiconductors for the development of energy-efficient power electronics and high-temperature applications.

Wide-bandgap semiconductors such as silicon carbide (SiC) and gallium nitride (GaN) enable higher switching frequencies, lower energy losses, and higher operating temperatures than conventional silicon devices. They form the foundation of modern power electronics in electric mobility, energy technology, industrial applications, and telecommunications.

The development of high-performance semiconductors requires a deep understanding of their thermal, electrical, and structural properties. Modern analytical methods provide important information about thermal conductivity, charge carrier transport, thermal stability, and material quality.

LINSEIS’s material characterization solutions enable the precise analysis of wide-bandgap semiconductors throughout the entire development process—from materials research to quality control.

Typical Challenges with Wide Bandgap Semiconductors

Relevant Questions

  • What is the thermal conductivity of SiC or GaN materials?
  • How does temperature affect electrical properties?
  • What is the charge carrier concentration of the material?
  • What is the mobility of the charge carriers?
  • How efficiently is waste heat dissipated?
  • What thermal stresses occur during operation?
  • How do defects affect material performance?
  • What properties do thin films and epitaxial layers have?
  • How does the material change at high temperatures?
  • Which materials are suitable for high-performance applications?


Relevant Material and Process Parameters

Parameter
Meaning
Thermal ConductivityEfficient Heat Dissipation in Power Semiconductors
Thermal DiffusivityAnalysis of Heat Propagation
Charge carrier concentrationEvaluation of electrical conductivity
MobilityOptimizing Electronic Performance
Electrical ResistanceReduction of power losses
Hall coefficientCharacterization of charge carriers
Interfacial resistanceOptimization of the heat transfer path
Coating ThicknessControl of thin-film processes
Thermal StabilityReliability at high temperatures
Defect DensityAssessment of Material Quality

Measurement Methods for Wide-Bandgap Semiconductors

Hall Effect Analysis (HCS)

Determination of charge carrier concentration, mobility, and electrical resistance for the development of modern wide-bandgap semiconductors.

Analysis of

  • Charge carrier concentration
  • Mobility
  • Hall coefficient
  • Electrical Resistance

Typical Applications

  • SiC
  • GaN
  • AlN
  • Epitaxial layers

Laser Flash Analysis (LFA)

Characterization of thermal transport properties for efficient thermal management in power semiconductors.

Analysis of

  • Thermal conductivity
  • Thermal diffusivity
  • Heat Transfer
  • Temperature-Dependent Properties

Typical Applications

  • SiC wafers
  • GaN Substrates
  • Ceramic Substrates
  • Performance Modules

Thin Film Analysis (TFA)

Analysis of the electrical and thermal properties of thin films and electronic materials.

Analysis of

  • Electric Transportation
  • Resistance
  • Charge Carrier Behavior
  • Thin-film properties

Typical Applications

  • Thin-film semiconductors
  • Sensors
  • Thermoelectrics
  • Microelectronics

Thin Film Laser Frequency Analyzer (TF-LFA)

Determination of the thermal conductivity and thermal interfacial resistances of thin films.

Analysis of

  • Thin-Film Thermal Conductivity
  • Interfacial resistance
  • Heat Transfer
  • Layer Structures

Typical Applications

  • Semiconductor chips
  • Epitaxial layers
  • MEMS
  • Microelectronics

Recommended Measurement Instruments for Wide-Bandgap Semiconductors

Case Study: Analysis of a Wide-Bandgap Semiconductor

Temperature-Dependent Resistance Behavior of Ge-Si-Sn-O Thin Films

The temperature dependence of electrical resistance is a critical parameter for the development of high-performance infrared sensors and microbolometers. This practical example demonstrates how Ge-Si-Sn-O thin films are fabricated using TFA L59 to evaluate their sensitivity and suitability for modern thermal imaging and sensor technologies.

Why Material Analysis Is Crucial for Wide-Bandgap Semiconductors

Power electronics systems are becoming increasingly compact and powerful. At the same time, the demands on efficiency, temperature resistance, and reliability are rising.

The combination of modern analytical methods makes it possible to:

  • Determination of Thermal Properties
  • Characterization of Electrical Transport Properties
  • Analysis of Thin Films and Interfaces
  • Thermal Stability Study
  • Assessment of Material Quality and Defects
  • Optimization of Manufacturing Processes

Applications – Semiconductors & Electronics

FAQ – Wide Bandgap Semiconductors

What are wide-bandgap semiconductors?

Wide-bandgap semiconductors have a wider bandgap than conventional silicon. The most important examples include silicon carbide (SiC), gallium nitride (GaN), and aluminum nitride (AlN).

These materials enable higher switching frequencies, lower energy losses, higher power densities, and higher operating temperatures than conventional silicon devices.

Thermal conductivity determines how efficiently heat loss can be dissipated. It directly affects the performance and service life of electronic components.

Hall-effect measurements make it possible to determine charge carrier concentration, mobility, and conductivity. These parameters are crucial for optimizing electronic components.

Depending on the research question, HCS, LFA, TF-LFA, TFA, DSC, and STA are used. Combining multiple techniques enables comprehensive material characterization.

They are used in electric mobility, charging infrastructure, renewable energy, industrial electronics, telecommunications, aerospace, and in high-temperature and high-performance applications.