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Thermoelectric Instruments

Seebeck-Coefficient / Resistivity / TEG and Peltier Modules / Thin Films

TEG-Tester

TIM-Tester new instrument

Linseis TEG Tester is a measurement system for temperature dependent conversion efficiency evaluations for thermoelectric generators (TEGs)

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LSR-3

Linseis LSR-3

Most advanced Seebeck Coefficient and Electric Resistivity (LSR) characterization of Bulk material and Thin-Films

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LZT-Meter

LZT-Meter

Combined LFA (Thermal Conductivity/Diffusivity) + LSR (Seebeck Effect and Electric Resistivity) for a complete ZT-Characterization

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HCS 1/10/100

Linseis instrument for hall effect HCS 1

The HCS System permits the characterization of semiconductor devices, it measures: mobility, resistivity, charge carrier concentration and Hall coefficient

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TFA

Linseis TFA

TFA – Thin Film Analyzer – Latest generation Lab-on-a-Chip technique with complete figure of merit ZT-Characterization of Thin-Films from the nm to µm range from -170°C up to 280°C

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TF-LFA

Linseis TF-LFA

TF-LFA – Time Domain Thermoreflectance (TDTR) – Thermal Diffusivity of Thin Films in the temperature range from -100°C up to 500°C.

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Seebeck-, Peltier-, and Thomson-Effect

Thermoelectricity describes the mutual influence of temperature and electricity in a material and is based on three basic effects: the Seebeck-effect, the Peltier-effect and the Thomson-effect.

The Seebeck-effect was discovered in 1821 by Thomas J. Seebeck, a German physicist, and describes the occurrence of an electric field when applying a temperature gradient in an electrically insulated conductor. The Seebeck coefficient S is defined as the quotient of the negative thermal voltage and the temperature difference and is a purely material-specific variable, which is usually given in the unit μV / K.

Conversely, this effect, called the Peltier-effect, causes a temperature gradient when applying an external current to the conductor. This phenomenon is due to the different energy levels of the conduction bands of the materials involved. Thus, as they pass from one material to another, the charge carriers must either absorb energy in the form of heat, thereby cooling the pad, or they can release energy in the form of heat, thereby heating the pad.

With fossil fuels becoming increasingly scarce and recent global warming gains from rising carbon dioxide emissions, the field of thermoelectricity has returned to public interest because of its effective use of waste heat. The aim is to use the waste heat of heat engines, such as automobiles or conventional power plants, by thermoelectric generators (TEG) to increase their conversion efficiency. But also for cooling applications by means of the Peltier effect, such as the thermostatic temperature-critical components in lasers, efficient thermoelectric materials are of great interest.

The thermoelectric conversion efficiency of a material is usually compared on the basis of the dimensionless figure of merit ZT. It is calculated from the Thermal Conductivity , the Seebeck-Coefficient and the Electrical Conductivity.

To cope with this development, we have developed an instrument for simple and extremely precise material characterization. The Linseis LSR-3 can determine both, the Seebeck-Coefficient and the Electrical Resistivity of a sample in a temperature range from -100°C to +1500°C in a single measurement.

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Thermoelectric Applications

Waste heat recovery

Wärmedämmung Eigenhaus

Semiconductors & Sensors

Labormessung

Energy & Power Generation

Solaranlage

Measurement and Sample Overview

Below you will find an overview of the different measuring instruments for thermal electric applications. This should serve as an orientation. If you have any questions about a measurement or a material, please feel free to send us a message using the contact form at any time.

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Green: measurement is possible

Yellow: measurement is probably possible

Grey: measurement is not possible

ModelLSR-3LSR-4LZTHCSTFA
InfoStandard PlatformHarman upgrade for LSR-3Combined LSR-3 + LFA 1000Cost efficient, low temp. and Hall ConstantThin films on Linseis chip
Measurement
Seebeck Coefficientja Smileyja Smileyja Smileyja Smileyja Smiley
Resistivity/Conductivityja Smileyja Smileyja Smileyja Smileyja Smiley
Hall Constant / Hall mobility / Charge Carriernein Smileynein Smileynein Smileyja Smileyja Smiley
Thermal Diffusivitynein Smileynein Smileyja Smileynein Smileyja Smiley
Thermal Conductivitynein Smileyja Smiley*Please follow notenein Smileynein Smileyja Smiley
Complete ZT Characterizationnein Smileyja Smileyja Smileynein Smileyja Smiley
Atmosphereja Smiley
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Temperature range-100 to +1500°C-100up to +1500 (Harman -100 up to 300)-100 up to +1100-150 up to +600-170 to +300°C
Price$$$$$$$$$$$
Sample type
Solidja Smileyja Smileyja Smileyja Smileynein Smiley
Thinfilmja Smileyeventuell smiley**Please follow noteeventuell smiley***Please follow noteja Smileyja Smiley

* Calculated Thermal Conductivity from Harman technique for direct ZT measurement. Harman technique is only applicable for “good thermoelectric samples” from -100°C up to +300°C.

** Seebeck Coefficient and Resistivity of thin films can be measured, but Harman technique for direct ZT and calculated Thermal Conductivity measurements is only applicable to solids, not thin films.

*** Seebeck Coefficient and Resistivity of thin films can be measured, but LFA technique is only applicable to solids and thicker coatings (approx. > 100 µm).

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Thermoelectric Brochure (PDF)

LSR, LZT, LFA, TF-LFA, TFA, Hall-Effect
Product Brochure
(PDF)

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Linseis Product Overview English

Product Overview
Brochure
ENGLISCH (PDF)

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