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Thermal Conductivity Instruments

LFA / THB / TIM-Tester / HFM and many more

The most common way to measure thermal diffusifity will be the well known Laser flash method (LFA). Here a sample is pulsed with a Laser and an IR detector on the opposite detects the temperature rise of the sample, what leads to the thermal diffusifity. If the density and specific heat capacity are known, the thermal conductivity can be calculated.

The TIM-Tester is our new instrument for the analysis of thermal interface materials like thermal fluids, thermal pastes (greases), phase change materials (PCM), solders or resilient thermal conductors. The TIM-Tester measures the thermal impedance of sample materials and identifies an apparent thermal conductivity.

The LFA process is extremely useful for gauging the quality and capabilities of materials such as the ceramic used in automobile brake systems or rocket engines. Another common application for this technology is in the chemical industry, where LFA is utilized to determine the conductivity of silicone oils and sodium nitrate. These are used as electrical insulators and phase change materials for storing and releasing thermal energy.

The heat flow meter (HFM) is a special instrument for quality control in factories. It needs bigger sample sizes but can measure the thermal conductivity with highest accuracy, using an exact controlled temperature gradient.

For thin film samples and micro samples, known from the computational industries, there are also the new thin film laser flash (TF-LFA) and thin film analyzer (TFA), that can measure the desired thermal conductivity and diffusivity with highest precision as well.

The Transient Hot Bridge method (THB) is made for solids, liquids and pastes and gives the thermal conductivity as direct result of the measurement with high accuracy within a few minutes. It is suitable for isolating materials as well as conducters like metals.

The LINSEIS Thermal Conductivity instruments operate in agreement with national and international standards such as ASTM E1461, DIN EN 821, BS EN 1159-2, ASTM C714, ASTM C518, ISO 8301, DIN EN 12667 EN 12 and ASTM D5470.

Linseis has become the global leader in thermal conductivity instrumentation — including thermal conductivity meters — because of our devotion to innovation and uncompromising standards. To learn more about what we have to offer, browse our product listings or get in touch with us today with any questions you may have.

THB – Basic, Advance, Ultimate

THB Basic, Advance, Ultimate - New Transient Hot Bridge instrument

THB – Transient Hot Bridge – measurement of thermal conductivity and thermal diffusivity with new sensors and intuitive software

Operating temperature: -150°C to 700°C

Details

LFA 1000

Laserflash - LFA-1000

LFA 1000 – True LaserFlash Analyzer- The premium device
Temperature range -125 °C/ -100 °C bis 500 °C and RT up to 1250°C/ 1600°C/ 2000°C/ 2800°C

Details

LFA 500

Lightflash - LFA-500

LFA 500 – LightFlash Analyzer – The robust workhorse
Temperature range -50 up to 500°C and RT up to 500°C/ 1000°C/ 1250°C (1450°C with boost)

Details

LZT-Meter

LZT-Meter

Combined LFA (Thermal Conductivity/Diffusivity) + LSR (Seebeck Effect and Electric Resistivity) for a complete ZT-Characterization

Details

HFM

HFM – Heat Flow Meter – The perfect solution for isolating materials

Temperature range:

  • Fixed 0 to 40°C
  • var. 0 to 100°C
  • -20 up to 75°C
  • var. -30 to 90°C
  • var. -20 to 70°C

Details

TIM-Tester

Linseis TIM Tester

The LINSEIS TIM-Tester (Thermal Interface Material Tester) measures the thermal impedance of sample materials and identifies an apparent thermal conductivity for a wide range of materials

Details

TF-LFA

Linseis TF-LFA

TF-LFA – Time Domain Thermoreflectance (TDTR) – Thermal Diffusivity of Thin Films
Temperature range -100°C up to 500°C

Details

TFA

Linseis TFA

TFA – Thin Film Analyzer – Latest generation Lab-on-a-Chip technique (for nm and µm thin films)

  • Thermal conductivity
  • Resistivity
  • Seebeck-Coefficient
  • Hall-Constant
  • Temperature range -170°C up to 280°C

Details

 

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Measurement and Sample Overview

Below you will find an overview of the different measuring instruments for thermal conductivity. This should serve as an orientation. If you have any questions about a measurement or a material, please feel free to send us a message using the contact form at any time.

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Green: measurement is possible

Yellow: measurement is probably possible

Grey: measurement is not possible

Model LFA TIM-Tester THB HFM TFA TF-LFA
Info Most universal tool For thermal interface materials For fast and easy measurements For insulating materials Thin films on Linseis chip For nm to μm films
Measurement
Thermal Conductivity eventuell smiley ja Smiley ja Smiley ja Smiley ja Smiley eventuell smiley
Thermal Diffusivity ja Smiley nein Smiley eventuell smiley nein Smiley eventuell smiley ja Smiley
Specific Heat Capacity eventuell smiley nein Smiley eventuell smiley nein Smiley ja Smiley nein Smiley
Thermal Resistivity nein Smiley ja Smiley nein Smiley ja Smiley nein Smiley nein Smiley
Defined Pressure on Sample nein Smiley ja Smiley ja Smiley ja Smiley nein Smiley nein Smiley
Atmosphere ja Smiley
nein Smiley ja Smiley
nein Smiley ja Smiley
ja Smiley
Temperature range -125 to +2800°C -20 to +300°C -150 to +700°C -40 to +90°C -170 to +300°C -100 to +500°C
Price $$ – $$$ $$ $ $$ $$$ $$$
Sample type
Solid ja Smiley ja Smiley ja Smiley ja Smiley nein Smiley eventuell smiley
Liquid ja Smiley eventuell smiley ja Smiley nein Smiley nein Smiley nein Smiley
Powder eventuell smiley eventuell smiley ja Smiley eventuell smiley nein Smiley nein Smiley
Paste eventuell smiley ja Smiley ja Smiley nein Smiley nein Smiley nein Smiley
Pad eventuell smiley ja Smiley eventuell smiley nein Smiley nein Smiley nein Smiley
Thinfilm eventuell smiley eventuell smiley nein Smiley nein Smiley ja Smiley ja Smiley

Quicklinks

Downloads

Overview

Linseis Produktbroschüre Thermal Conductivity

LFA, TF-LFA,TFA, THB
Product Brochure
(PDF)

Download

Linseis Product Overview English

Product Overview
ENGLISH (PDF)

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