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TFA – thermoelectric thin film – thermoelectric properties – semiconductor

Full ZT – Figure of Merit Characterization of a thermoelectric thin film PEDOT:PSS / Seebeck coefficient / electric conductivity / thermal conductivity

Thermoelectric materials are used in thermoelectric generators converting a temperature gradient in a voltage.  To characterize the performance of a thermoelectric material the so called figure of merit (ZT) is used. In order to calculate the figure of merit, thermal conductivity, electric conductivity and the Seebeck coefficient have to be known.

Compared to bulk materials with the same composition, thin layers show lower thermal conductivities while electrical conductivity and Seebeck coefficient are much less affected resulting in higher ZT-values. PEDOT:PSS is a typical example for organic conductors and thermoelectric materials.

App. Nr. 02-013-003 TFA – thermoelectric thin film – thermoelectric properties - semiconductor

App. Nr. 02-013-003 TFA – thermoelectric thin film – thermoelectric properties – semiconductor

App. Nr. 02-013-003 TFA – thermoelectric thin film – thermoelectric properties - semiconductor - TFA Chip

App. Nr. 02-013-003 TFA – thermoelectric thin film – thermoelectric properties – semiconductor – TFA Chip

Electrical conductivity, thermal conductivity and Seebeck coefficient were measured in a temperature range of 110 K to 350 K on a PEDOT:PSS  film  of 15 µm thickness prepared by drop casting.  From these parameters ZT was calculated.

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TFA

TFA – Thin Film Analyzer – Latest generation Lab-on-a-Chip technique with complete figure of merit ZT-Characterization of Thin-Films from the nm to µm range from -170°C up to 280°C

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