Thin Film Analysis (TFA) - Thin film characterization
Thin Film Analysis - Measuring samples from Nanometer (nm) up to Micrometer (µm) scale
[Translate to Korea:] Physical properties from thin-films are becoming more and more important in industries such as, phase-change optical disk media, thermoelectric materials, light emitting diodes (LEDs), phase change memories, flat panel displays, and the semiconductor industry. All these industries deposit a film on a substrate in order to give a device a particular function. Since the physical properties of these films differ from bulk material, these data are required for many different applications.
Based on the well established Laser Flash technique, the LINSEIS “Thin-Film- Laserflash” now offers a whole range of new possibilities to analyze thermophysical properties of thin films from 80nm up to 20μm thickness.