{"id":27019,"date":"2024-07-22T11:40:59","date_gmt":"2024-07-22T09:40:59","guid":{"rendered":"https:\/\/www.linseis.com\/messgeraete\/electrical-property\/hcs-1-10-100\/"},"modified":"2026-07-23T13:55:08","modified_gmt":"2026-07-23T11:55:08","slug":"hcs-l36","status":"publish","type":"messgeraete","link":"https:\/\/www.linseis.com\/en\/instruments\/hall-effect-analyzer\/hcs-l36\/","title":{"rendered":"HCS L36"},"content":{"rendered":"\t\t
\n\t\t\t\t
\n\t\t\t\t\t
\n\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t
\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tFeatures<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t
\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tSpecifications<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t
\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tSoftware<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t
\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tApplication<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t
\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tDownloads<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t
\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tRequest a quote<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
\n\t\t\t\t\t
\n\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t

HCS L36: Hall Effect Characterization System<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
\n\t\t\t\t\t
\n\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

The LINSEIS HCS L36<\/b> is a modular Hall-effect<\/strong><\/a> characterization system for the precise determination of electrical transport properties of semiconductors<\/strong><\/a>, thin films<\/strong><\/a> and functional materials. It simultaneously determines carrier concentration, Hall mobility, Hall coefficient and resistivity over a wide temperature range under vacuum or controlled atmospheres.<\/p>

With three system configurations, interchangeable sample holders and optional Seebeck<\/strong><\/a>, Hall bar and illumination modules, the HCS L36 can be tailored to research, development and industrial quality control.<\/p><\/div><\/div><\/div><\/div>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

\n
\n
\n\t\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t
<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t

Unique Features<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\n<\/div>\n
\n
\n\t\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"Icon\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\n<\/div>\n\n<\/div>\n
\n
\n \t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

Electronics Upgrade<\/h3>

The redesigned HCS L36 electronics provide higher measurement accuracy, improved signal stability and faster data acquisition. Optimized hardware architecture combined with intelligent control electronics ensures reliable Hall-effect measurements over the entire temperature range.<\/p>

The advantages of the new electronics include:<\/p>

  • Higher signal stability<\/strong>
    Ensures reliable Hall voltage measurements, even for low-mobility or high-resistance samples.<\/li>
  • Improved measurement accuracy<\/strong>
    Optimized electronics minimize noise and increase the precision of electrical transport property determination.<\/li>
  • Faster data acquisition<\/strong>
    Shorter measurement times through optimized control and signal processing.<\/li>
  • Excellent reproducibility<\/strong>
    Highly stable electronics guarantee consistent results across repeated measurements and long-term operation.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\n<\/div>\n
    \n \t\t
    \n\t\t\t\t
    \n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\n<\/div>\n\n<\/div>\n
    \n
    \n \t\t
    \n\t\t\t\t
    \n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\n<\/div>\n
    \n \t\t
    \n\t\t\t\t
    \n\t\t\t\t\t\t\t\t\t

    New hardware features<\/h3>
    • Halbach magnet technology<\/strong>
      Generates a highly homogeneous magnetic field with improved field stability, enabling precise and reproducible Hall-effect measurements over the entire sample area.<\/li>
    • Modular sample holder concept<\/strong>
      Interchangeable plug-and-play sample holders support Van der Pauw, Hall bar, Seebeck and illuminated measurements while minimizing setup time.<\/li>
    • Integrated EPROM sample holder recognition<\/strong>
      Intelligent sample holders are detected automatically and the corresponding measurement parameters are loaded directly into the software, reducing user interaction and setup errors.<\/li>
    • Wide-range temperature chamber<\/strong>
      The gas-tight measurement chamber enables Hall measurements from cryogenic temperatures up to 600 \u00b0C under vacuum or controlled gas atmospheres.<\/li>
    • Upgradeable system architecture<\/strong>
      The modular hardware concept allows easy expansion from Basic to Advanced or Ultimate configurations, including AC Hall measurements, lock-in amplifier integration and additional characterization modules.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\n<\/div>\n\n<\/div>\n
      \n
      \n\t\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t\t\t\t
      \n\t\t\t\t\t\t
      \n\t\t\t\t\n\t\t\t\t\t

      Design improvements <\/h3><\/span>\n\t\t\t\t\t\t\t\n\t\t\t<\/path><\/svg><\/span>\n\t\t\t<\/path><\/svg><\/span>\n\t\t<\/span>\n\n\t\t\t\t\t\t<\/summary>\n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t\t\t\t\t\t

      The redesigned HCS L36 combines a compact instrument layout with improved accessibility and ergonomic operation. The new housing design, intuitive touch display and modular architecture simplify daily operation while providing maximum flexibility for a wide range of Hall-effect characterization tasks.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/details>\n\t\t\t\t\t\t

      \n\t\t\t\t\n\t\t\t\t\t

      Intelligent sample holder recognition <\/h3><\/span>\n\t\t\t\t\t\t\t\n\t\t\t<\/path><\/svg><\/span>\n\t\t\t<\/path><\/svg><\/span>\n\t\t<\/span>\n\n\t\t\t\t\t\t<\/summary>\n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t\t\t\t\t\t

      The HCS L36 automatically detects the installed sample holder using integrated EPROM technology. Measurement parameters are loaded automatically, reducing setup time and minimizing the risk of incorrect configurations.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/details>\n\t\t\t\t\t\t

      \n\t\t\t\t\n\t\t\t\t\t

      Modular sample holder system <\/h3><\/span>\n\t\t\t\t\t\t\t\n\t\t\t<\/path><\/svg><\/span>\n\t\t\t<\/path><\/svg><\/span>\n\t\t<\/span>\n\n\t\t\t\t\t\t<\/summary>\n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t\t\t\t\t\t

      The modular plug-and-play concept supports a wide variety of sample holders for Van der Pauw, Hall bar, Seebeck and illuminated measurements. Sample holders can be exchanged within seconds without recalibration, allowing the system to adapt quickly to different applications.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/details>\n\t\t\t\t\t\t

      \n\t\t\t\t\n\t\t\t\t\t

      Software improvements <\/h3><\/span>\n\t\t\t\t\t\t\t\n\t\t\t<\/path><\/svg><\/span>\n\t\t\t<\/path><\/svg><\/span>\n\t\t<\/span>\n\n\t\t\t\t\t\t<\/summary>\n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t\t\t\t\t\t

      The LiEAP software combines measurement control, automation and advanced data evaluation within a single platform. Automated measurement sequences, intelligent parameter management and comprehensive reporting improve efficiency while ensuring maximum reproducibility.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/details>\n\t\t\t\t\t\t

      \n\t\t\t\t\n\t\t\t\t\t

      Upgradeable system architecture <\/h3><\/span>\n\t\t\t\t\t\t\t\n\t\t\t<\/path><\/svg><\/span>\n\t\t\t<\/path><\/svg><\/span>\n\t\t<\/span>\n\n\t\t\t\t\t\t<\/summary>\n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t\t\t\t\t\t

      The modular design allows the HCS L36 to grow with your requirements. The system can be upgraded from the Basic to the Advanced or Ultimate configuration and expanded with optional modules such as AC Hall measurements, lock-in amplifier integration, Seebeck measurements or illumination systems.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/details>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t