NEW - Linseis Hall Effect Measurement System - L79/HCS
The new development allows the characterization of semiconductor devices, it measures: mobility, resistivity, charge carrier concentration and Hall coefficient.
News, Events and Exhibitions
Exhibitions & Conferences 2017 with LINSEIS participation.
Hall Coefficient measurement from LN up to 240°C. Maximum field strength up to 1T.
Linseis Presents its new low temperature option for the L75 PT Vertical Dilatometer & TMA PT 1000 Thermomechanical Analyzer
Download Thermal Analysis & Dilatometer Newsletter