NEW - Linseis Hall Effect Measurement System - L79/HCS
The new development allows the characterization of semiconductor devices, it measures: mobility, resistivity, charge carrier concentration and Hall coefficient.
News, Events and Exhibitions
Exciting new features with the all new LFA 500.
Exhibitions & Conferences 2017 with LINSEIS participation.
Hall Coefficient measurement from LN up to 240°C. Maximum field strength up to 1T.
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