TFA - Thin Film LaserFlash Apparatus
Over the past few decades, the flash method has developed into the most commonly used technique for the measurement of the thermal diffusivity and thermal conductivity of various kinds of solids, powders and liquids.
Based on this very well established technique, the Linseis Laserflash for thin films (TFA) now offers a whole range of new possibilities to analyze thermophysical properties of thin films from 80nm up to 20 μm thickness.
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News, Events and Exhibitions
Exhibitions & Conferences 2016 with LINSEIS participation.
Hall Coefficient measurement from LN up to 240°C. Maximum field strength up to 1T.
Linseis Presents its new low temperature option for the L75 PT Vertical Dilatometer & TMA PT 1000 Thermomechanical Analyzer
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